Abstract
The current-voltage characteristic of a long three-layer semiconductor diode of the type: p+−n−n+, p+−n−p+, n+−n−n+, etc. has been calculated. Expressions are obtained for the current-voltage characteristic of a three-layer semiconductor structure, the base of which is made of a compensated semiconductor, taking into account the strength of the external electric field. It is shown that due to the presence of zero, minus and plus charged impurities in a compensated semiconductor, the dependence of the concentration of electrons and holes is non-linear. KEY WORDS: current-voltage characteristic, semiconductor structure, electrons and holes.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: EPRA International Journal of Multidisciplinary Research (IJMR)
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.