Theory of paraxial lateral aberrations of electrostatic imaging electrostatic electron optics based on asymptotic solutions and its verification

Abstract

In imaging electron optics, study of geometrical lateral aberrations of third order and paraxial lateral aberrations of second order has traditionally been paid more attention to, but the existence of paraxial chromatic aberrations of third order and paraxial chromatic aberrations of magnification of third order was almost ignored, and the general form of paraxial lateral aberration has not been studied theoretically. In the present paper, the paraxial lateral aberrations expressed in general form have been derived emphatically on the basis of asymptotic solutions of paraxial equation. The relationship between the coefficients of asymptotic solutions has been investigated, which proves that the coefficients of asymptotic solutions are related each other. Through a bi-electrode electrostatic spherical concentric system model, two special solutions expressed by asymptotic solutions and accurate solutions in a bi-electrode electrostatic spherical concentric system have been deduced, and the paraxial lateral aberrations have been verified and tested, in which the aberration coefficients are solved by asymptotic solutions of paraxial equation. Result completely proves that the approach based on asymptotic solutions to solve the paraxial lateral aberrations are practicable and accurate enough. The paraxial chromatic aberration of magnification of third order and the paraxial chromatic aberration of third order have been firstly derived, and the Recknagel–Artimovich formula of paraxial chromatic aberration of second order which possess an greatest part in the whole paraxial lateral aberrations has been deduced and confirmed. A simple and clear form for expressing paraxial lateral aberrations of imaging electron optics is suggested for practical use. Results of the present paper will have theoretical value for aberration theory of imaging electron optics and practical significance for the design of image tubes.