Abstract
The theory of the reflecting properties of multilayer monochromators is developed on the basis of both the kinematical and the dynamical theory of neutron scattering with emphasis on the way in which the flux and polarization of the reflected beam depends on the parameters that characterize the multilayer. The effect of random variations in layer thickness is investigated using a cumulant expansion method. The contamination of the reflected beam due to both higher-order Bragg reflections and specular reflection is also discussed.
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