Abstract
We have studied the interactions responsible for the contrast formation in nc-AFM imaging of theα-alumina(0001) surface using the oxide and Si dangling bond tip models. The full imagesimulation performed using the rigid oxide tip and common cantilever parameters suggeststhe possibility of atomic and chemical resolution on the plane surface in a narrow range ofexperimental parameters. The interaction of both the oxide and Si dangling bond tips withthe surface is stronger at the centres of triangles formed by three oxygen ions. This makesthe image interpretation for the Si dangling bond tip unique—the bright spots shouldcorrespond to the centres of O triangles and centres of dark spots are located above thesurface Al ions. In the case of the oxide tip, the image pattern depends on thetip polarity and is different, but easily recognizable. However, only Al ions ortriangles formed by three oxygen ions could be resolved in the simulated images.
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