Abstract
Optical parameters (the absorption index and scattering index) of an alumina ceramic are determined in the wavelength range 1 – 20 μm based on measurements of the total reflection coefficients of layers of different thicknesses. The measurement data is used to determine the spectral emissivity of arbitrarily thick layers of the material. Literature data on the temperature dependence of the absorption index of sapphire is used to model the temperature dependence of the spectral and integral emissivities of the alumina ceramic. The information obtained from the study can be used in thermophysical calculations.
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