Abstract
The Fourier inversion method recently introduced to the EXAFS analyses has enabled to give the information on the local atomic arrangement around the absorbing atoms. This method, complimentary to the traditional X-ray structure analysis one, has proved to be very useful to get information about the local structure in both amorphous and crystalline materials.The present review mainly describes the followings: 1) Why is EXAFS observed?2) Why is the new method of analysis effective? 3) How to analyze the data? 4) What are the remaining difficulties? 5) What are variational methods?In view of the fact that synchrotron radiation sources with an intensive continuous X-ray spectrum soon become popular, the above method will be widely used in various fields including biophysics.
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