Abstract
This article presents a theoretical and numerical study by the reflection acoustic microscope of the surface acoustic waves propagation at the interface formed by a thin layer and the coupling liquid (water). The thin layer presents a gradient in its acoustical parameters along its depth. A stable transfer matrix method is used to compute the reflectance function of the surface acoustic modes radiated in the coupling liquid. This function is required to calculate the theoretical acoustic material signature which allows to determine the phase velocity of these modes. In order to characterize the influence of the gradient on the acoustic material signature, a few gradient functions are studied. The numerical results obtained show that the acoustic material signature can be used to characterize these profiles.
Highlights
THEORYThere are several methods for analyzing the V(z) curve in the output of a focus transducer for the solid structures and this section will expose Auld and Weise et al andZinin et al approaches for determining V(z) curve expression| P a g e www.ijacsa.thesai.org [14][15][16][17].The figure 1 shows the defocused acoustic lens schema for a reflection acoustic microscope
This article presents a theoretical and numerical study by the reflection acoustic microscope of the surface acoustic waves propagation at the interface formed by a thin layer and the coupling liquid
A stable transfer matrix method is used to compute the reflectance function of the surface acoustic modes radiated in the coupling liquid
Summary
The acoustic microscope is an ultrasonic wave sensor, at the presence of an electrical excitation in its input allows to generate an acoustic wave capable to penetrate into the structures with a high resolution. The invention of the line focus acoustic microscope allows the quantitative measurement of the elastic properties and thicknesses of isotropic and anisotropic layered materials [8][9]. Today many techniques concerning the quantitative measurement by the acoustic microscope are developed to characterize the elastic properties of different solids. In this study we will focus on the numerical investigation of the acoustic material signature by the reflection acoustic microscope with spherical cavity to evaluate the influence of the gradient function shape on V(z) curve and on its phase for the continuously thin graded layer on a solid substrate. The present study offers the possibility to characterize the gradient profiles in the elastic properties of a thin layer by the V(z) curve technique and by the dispersion curve of the surface acoustic wave.
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: International Journal of Advanced Computer Science and Applications
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
