Abstract
Resonant inelastic X-ray scattering (RIXS) spectra for Ni 2 p to 3 d excitation and 3 d to 2 p de-excitation of NiO are studied both theoretically and experimentally. Theoretical calculations with a single impurity Anderson model (SIAM) describe the charge transfer (CT) and d – d excitations in RIXS, and detailed study is made for the CT energy. High resolution RIXS measurements reveal the precise d – d excitation structure and its polarization dependence, and they are well reproduced by the SIAM calculation.
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