Abstract

Analytic solutions of the convection–diffusion equation (CDE) have been obtained in the case of the exponential band tail states for a reflecting front electrode. Analytic expressions for the transient current density in time-of-flight (TOF) experimental conditions have been obtained. An assessment of the distortion by diffusion has been made for a data analysis of the common TOF method. A new method for calculating a charge carrier mobility and other transport parameters in thin layers of disordered materials has been proposed using the weak-field TOF experiments. The obtained results can provide the use of TOF method for optimizing the characteristics and designing thin-film electronic devices.

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