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Abstract
General expressions for predicting line shapes in resonant Auger electron spectra are derived. These formulas take into account explicitly the interference effects due to the presence of several resonances embedded in the continua of different final states having finite lifetimes and include also the effects due to the finite bandwidth of the incident radiation and the finite resolving power of the electron spectrometer. The characteristic features of the Auger resonant Raman effect are derived analytically. The theory is applied to the analysis of high resolution resonant Auger spectra recently measured at the VUV beam line at Elettra, Sincrotrone Trieste.
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