Abstract
An extremely sensitive silica glass prism based SPR sensor with indium tin oxide (ITO) layer is presented and theoretically analyzed. The sensitivity of the sensor enhances with the increase in the thickness of ITO layer. With optimized values of thickness of ITO layer and incident wavelength to be 50nm and 1600nm, respectively, the proposed sensor offers high sensitivity of 164°/RIU.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
