Abstract
Hefei Light Source (HLS) is being upgraded to HLS II. Its emittance will be much lower than before, therefore the Touschek scattering will increase significantly and become the dominant factor of beam loss. So it is necessary to build a new beam loss monitoring (BLM) system that, in contrast to the old one, is able to obtain the quantity and position information of lost electrons. This information is useful in the commissioning, troubleshooting, and beam lifetime studying for HLS II. This paper analyzes the distribution features of different kinds of lost electrons, introduces the operation parameters of the new machine and discusses how to choose proper monitoring positions. Based on these comprehensive analyses, a new BLM system for HLS II is proposed.
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