Abstract
The precise X-ray diffraction structural study of a nanocrystalline Cu sample processed by severe plastic deformation was carried out. The obtained results were compared with the data from an initial reference Cu sample. By analysis of the centroid position, broadening, shape of Bragg reflections and background integrated intensities from these two samples, such structural features as a lattice parameter, crystallite size, r.m.s. microstrain, dislocation density, Debye-Waller parameter and atomic displacements were determined. A conclusion concerning the specific defect structure in the nanocrystallite Cu sample was drawn.
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