Abstract
Thin films of Ni-Fe were electrodeposited onto Cu-substrates, subsequently stripped from their substrates and examined by Lorentz microscopy. The long range wavelengthλ LR of the magnetization ripple, the anisotropy fieldH K, the distance between crossties in cross-tie walls, and average crystallite size were determined for several films. Within a certain range of anisotropy fields the relationshipλ LR=2.99H+ −1/2 +0.2 micron was experimentally found for as-stripped films. Each film was also given a series of annealing treatments. A large decrease of anisotropy field, and an increase of ripple wavelength occurred after the first few anneals. On increased annealing no significant change in ripple wavelength could be measured although the anisotropy field continued to decrease. This result might suggest that only a part ofH K is effective in determining the wavelength.
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