Abstract

In the present paper, we analyze the role of in situ grown BaZrO3 (BZO) inclusions in YBa2Cu3O7−x (YBCO) thin films prepared by chemical solution deposition using a low fluorine coating solution, on the field angle dependence of the critical current density, J c (𝜃), data using the vortex path model. In order to form a coherent picture on the BZO doping influence on the pinning properties of the YBCO matrix, detailed structural analyses performed by X-ray diffraction techniques and microstructural evaluation by transmission electron microscopy are also presented. The evaluation of different contributions to the overall, J c , permitted us to prove the effectiveness of the BZO inclusions acting as isotropic pinning centers, reflected in a uniform component of high relative value with respect to other components. For the studied 10 mol % BZO doping concentration, a threefold increase in the critical current density, J c , of the YBCO host is measured, in self-field at 77 K, corresponding to a value of J c =2.9MA/cm2, whereas a factor 10 is measured at 1 T (J c =0.35 MA/cm2).

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call