Abstract
We carried out a systematic study of typical defect contrasts invarious single grains of icosahedral Al-Pd-Mn quasicrystals. White-beamtopographs with different sample-to-detector distances and multiple-crystaltopographs with different sample-to-detector distances, different workingpoints on the rocking curve and different harmonic reflections have beenrecorded. Despite the extreme geometrical resolution at the ID19 topographybeamline of the ESRF, white-beam topography showed reasonable (not blurred)contrast only for very short sample-to-detector distances ({<}4 cm).Depending on the defect type, in synchrotron multiple-crystal topography thedefect contrast changes considerably as a function of the position of theworking point on the rocking curve. Under the special conditions chosen, thedependence of contrast shape and size on the harmonic reflection used wasrather weak.
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