Abstract
Coatings are applied to surfaces for a variety of reasons: to enhance their appearance, to protect the substrate, to augment the adhesion to other layers, or to functionalize them for further reactions. To evaluate the efficacy of the coating, it is often necessary to analyze the substrate and the coating to ensure that the needed characteristics are present. To this end, the use of x-ray photoelectron spectroscopy (XPS), contact angle, and atomic force microscopy (AFM) can provide information about the surface composition, its morphology, and its ability to be wetted with various solvents. Scanning electron microscopy with energy dispersive x-ray analysis (SEM/EDX) and Fourier transform infrared spectroscopy (FTIR) can provide a clear picture of the near surface components as well as the continuity of coatings. All of these aspects are valuable in evaluating a coating and essential when problems are encountered. The application of these techniques to the analysis of coatings is discussed.
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