Abstract
An improved method is detailed, making use of electron diffraction of individual crystals in the electron microscope, for determination of the unit-cell dimension most nearly parallel to the electron beam. A series of diffraction patterns is recorded from a crystal tilted through known angles by the device normally used for making stereomicrographs. One of these patterns serves as a datum, for location on each of the others of the centre of its almost circular Laue zones. A new method is described for calibration of the instrument without using additional apparatus; all the factors which vary with the electron-beam potential can then be derived from a single diffraction pattern of a standard substance. A graph has also been prepared to allow correction of errors in calculation due to large angles between the third-row axis and the electron beam. The improvement in accuracy due to the procedure is illustrated by results obtained using crystals of known unit-cells.
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