Abstract
It is shown that the beam tilt circuitry of an electron microscope may be used to determine lattice constants. The method has certain advantages over the usual techniques of photographing diffraction patterns: it is rapid, measurements are not affected by choice of accelerating voltage or camera constant and the effects of lens aberrations effectively cancel. Interplanar spacings may be obtained to within +or-0.1% for polycrystalline samples. Single crystal samples permit spacing determinations accurate to +or-0.06% and interplanar angles to +or-0.05 degrees .
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