Abstract
We describe a method for using synchrotron radiation to measure accurately electron attenuation lengths in condensed molecular solids as a function of electron energy. It consists of measuring the attenuation of photoelectrons from a well characterized, relatively inert, cooled surface as a condensable overlayer is deposited. As photoelectrons from the substrate escape they pass through and are scattered in the overlayer. This scattering appears as a decrease in the intensity of the substrate photoelectron peak. The measurement of this decrease as a function of layer thickness gives the electron attenuation lengths directly. By using monochromatized synchrotron radiation for the photoemission excitation source, one can tune the photon energy and, hence, obtain the attenuation lengths as a function of electron kinetic energy. The techniques developed for obtaining a uniform overlayer film and for determining its thickness are given in detail. These techniques are applicable to most condensable sample that can be introduced into vacuum system as a gas.
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