Abstract
LOW-LEVEL electronic or electrical measurements are particularly susceptible to errors introduced by external electromagnetic influences. The coupling of spurious electromagnetic energy into a measuring system not only may result in the receipt of false information but also can sometimes cause the complete masking of the desired data as well. For these reasons, many low-level measurements, such as the determination of crystal characteristics, filter insertion loss, noise measurements, and the like, must be made in a location as free as possible from such interference. In a laboratory, such isolation from interference is usually achieved by completely enclosing an area in copper or bronze screening. By shielding off a region relatively free of external interference in this way, a working area is provided within which sensitive electronic measurements can be made.
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