Abstract
The adoption of polished Si carriers was studied for the sensitive elemental analysis of aerosol particles using total-reflection X-ray fluorescence (TXRF) spectrometry. The surface roughness of the Si carrier measured by atomic force microscopy was found to be smaller than those of glassy carbon and quartz glass carriers, which are commonly used for TXRF analysis. The detection limits of elements for the Si carrier were superior to those for the glassy carbon and the quartz glass carriers, presumably due to its smaller surface roughness. For example, the detection limit of Sr for the Si carrier was 9 pg, which was 100 times and 3 times lower than those for the glassy carbon and the quartz glass carriers, respectively. The Si carriers could be successfully applied to the direct aerosol particle collection by impaction and the subsequent elemental analysis by TXRF. From the results of the elemental analysis of aerosol particles, the variations in the concentrations of K, Ca, Ti, V, Cr, Mn, Fe, Ni, Cu, Zn Sr and Pb with time could be clarified.
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