The use of shorter wavelengths in X-ray diffraction in relation to scintillation counting

Abstract

After referring to the advantages of scint i l lat ion count ing discussed in earlier papers, in par t icular to the high yield i t offers in the Mo K range, the conditions are discussed which a crystal -counter powder goniometer mus t sat isfy in order to be adap ted to the small deflection angles encountered wi th short wavelengths and to be free of aberrat ions which depend on the individual powder specimen and set t ing and which therefore cannot be allowed for on general terms. Two ar rangements complying wi th these conditions are described.