Abstract
ABSTRACTRHEED is an important method for the in situ characterization of surfaces. Until recently, this characterization has not used the intensities of RHEED reflections. Improved methods of calculation have made it possible to simulate RHEED patterns from bulk-terminated, reconstructed and stepped surfaces. From the comparison between simulated and experimental patterns, it is now possible to refine the positions of atoms in surfaces and to determine the density of steps on surfaces (well almost).
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