Abstract
The formation of a continuous contact in a silicon solar cell with high percentage area of Ag crystallite ensures low contact resistance. This work utilizes ImageJ open source software to measure and analyze the percentage area of Ag crystallite and other impurities in a contact of a silicon solar cell. It measures the percentage area of Ag crystallite in the contact of Si solar cells with three different Ag pastes: A, B, and C. The A-paste repeatedly shows high percentage area of Ag crystallite, fill factor (FF) and the lowest contact resistance, followed by the B-paste, and finally the C-paste. With the data collected and analyzed, an inverse correlation was shown between the percentage area of Ag crystallite and the contact resistance.
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