The use of bowed reverse twist disclination lines for the measurement of long pitch lengths in chiral nematic liquid crystals†

Abstract

A novel method is described for the measurement of long pitch lengths in chiral nematic liquid crystals using the bowing of reverse twist disclination lines in 90° twisted nematic devices. The method has been used to measure pitch lengths of up to 50 mm, significantly longer than previously possible using existing methods. † The research was performed in part at the Department of Chemistry, The University of York, Heslington, York YO10 5DD, UK.