Abstract
The problems associated with the preparation and loading of a sample of cesium into the working chamber of a surface spectrometer are considered. It is shown that the use of special devices for the selection and storage of chemically active samples in an inert cryogenic medium makes it possible to obtain a sample without visible impurity layers. The sources of impurities are analyzed and the features of obtaining the atomically clean surface of cesium are considered. It is noted that the best way to obtain a clean surface of cesium is electron bombardment within a few seconds.
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