Abstract
A 1.8 MeV He-beam from a Van de Graaff accelerator has been used to demonstrate that back-scattering techniques can be usefully applied to study certain problems related to the interaction between coatings and paper substrates and between printing inks and coated or uncoated paper or plastic substrates. In particular, information on distribution profiles of various components can be obtained. The technique and some of its practical aspects are briefly described.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
