Abstract
The article describes research into the use of acoustic emission elastic waves (AE) for diagnosing insulated-gated bipolar transistors (IGBTs). Currently used in many modern shipboard power electronic systems, IGBTs are crucial components required to operate with extreme reliability. The acoustic emission elastic waves method was used to determine the acoustic signals of switching transistor and can be used to monitor early stages of damage. Transistor diagnostics makes use of selected frequency descriptors of AE and appropriate signal analysis.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
