The use of a piezoelectric force sensor in the magnetic force microscopy of thin permalloy films

Abstract

A piezoelectric force sensor is suggested for magnetic force microscopy (MFM) purposes. Added between the piezoelectric resonator and the magnetic probe is a mechanical force amplifier in the form of a thin, long resonant arm with an integral micro-rod whereby the amplitude of the force acting on the probe is amplified by a factor of 20 to 40 at a low noise level. When the sensor was operated in air, its noise floor was found to be 1.4 pN (RMS) at a bandwidth of 100 Hz. The piezoelectric sensor requires no repeated calibration; and it is capable of operating in a vacuum, and at cryogenic temperatures. By using this sensor we carried out the MFM of ultrathin (1.5- and 3-nm-thick) Ni79Fe21 permalloy films. The 1.5-nm-thick permalloy films studied have a nanoisland structure, whereas 3-nm-thick ones are contiouous. Domain structures were found in both. The MFM image was found to suffer substantial changes when the external magnetic field was altered by 1 Oe. The structures under study featured both “elastic” and “viscous” magnetic force components.