The unique capability of X-ray photon spectroscopy and X-ray excited Auger electron spectroscopy in identifying the sp2/sp3 ratio on the surface of growing carbon films

Abstract

Abstract The C KVV Auger spectra of polymers: polyethylene (sp3), p-quaterphenyl (sp2) and polystyrene (sp2/sp3=3/1) have been studied. The possibility for a synthesis of Auger spectrum for polystyrene by that for p-quaterphenyl (three parts) and polyethylene (one part) is shown. A combination of X-ray photon spectroscopy (XPS) and X-ray excited Auger electron spectroscopy (XAES) data were used for study a chemical states of carbon atoms on glassy carbon surface before (GC1) and after (GC2) scratching. A magnetron sputtering of graphite in the gas mixtures Ar+C6H12, Ar+CF4 and Ar+O2 have been investigated ex situ by XPS and XAES. The formation and relative concentrations of C–O, CO; and C–F, C–F2 bonds for sputtering in Ar+O2 and Ar+CF4 mixtures, respectively, has been determined by XPS. The transition of carbon atoms from the sp2-bonding to the sp3-hybridized state has been observed by XPS and XAES.