Abstract
The trapping of electrons in localized states in polystyrene has been studied by means of an electron beam technique. A 2.2-kV beam is used to inject a short pulse of charge into the free surface of a thin film of the polymer, and a second electron beam monitors the surface potential of the film. The surface potential is related to trapped charge density and to the depth of charge penetration. By defining a trapping parameter alpha =1/ mu tau E, one can relate the incremental buildup of surface potential to the injected charge density and carrier range. The release of electrons from traps is analyzed in terms of a time and temperature dependent demarcation energy E/sub m/. This energy is related to elapsed time since charge injection via the equation E/sub m/=kT1n(vt). Time dependence of charge decay is thus related to the energy distribution of traps in the polymer.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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