Abstract
The tomographic atom prob (TAP) is the most advanced of the three‐dimemsional atom probes currently in use. Atom probes are unique in that both the lateral and the depth resolution are high. The genera; development of atom probes and the principle of operation ot the TAP, in which the sample is field evaporated atomic loayer by atomic layer, are outlined. The analysis of a nickel base superalloy is given as an example of an application in metallurgy.
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