Abstract
In the framework of a general Landau free energy function, which is used in conventional ferroelectrics, we investigate the ferroelectric and magnetic properties of multiferroic epitaxial BiFeO3 thin films. It is shown that the properties of BiFeO3 thin films, such as lattice parameter, polarization, and magnetization, etc., are functions of misfit strains. The film thickness dependence of epitaxial strains due to relaxation by misfit dislocations during film deposition is incorporated into the model by using an effective substrate lattice parameter. Therefore, the thickness dependence of ferroelectric and magnetic properties in BiFeO3 epitaxial thin films is well explained.
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