Abstract
Co 35Pd 65 films have been prepared by the vapor deposition method. The thickness of the films varies from t = 150 to 2500 A ̊ . We have measured the electrical resistivity ρ, anisotropic magnetoresistance Δρ/ ρ 0, and saturation magnetization M s of these films at room temperature. The crystal structure and grain size D of the films were also characterized. Our interest is in the thickness dependence of these quantities. Using the various scattering mechanisms, the surface, bulk (impurity and phonon), and grain-boundary terms of the total resistivity and anisotropic magnetoresistance could be separated and estimated quantitatively. We found that, for Co 35Pd 65 films, although grain-boundary scattering makes a significant contribution to the total electrical resistivity ρ over the whole thickness range, it has little effect on the (absolute) anisotropic magneto-resistivity Δρ, so long as t > 500 A ̊ .
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