Abstract
A thermodynamic model has been developed for the case of oxygen incorporation into III–V semiconductor layers grown by MBE. The oxygen incorporation occurs from oxygen containing species present in the MBE growth chamber. The model shows under which conditions of temperature and pressure an oxygen containing species is an important source of oxygen to the growing semiconductor, and how those conditions must be changed to make oxygen incorporation less likely. Results are presented for the interaction of the oxygen containing species CO, CO 2, H 2O, As 4O 6, P 4O 6, Ga 2O and In 2O with the semiconductors GaAs, GaAlAs, GaInAs and InP. It is shown that substantial oxygen incorporation is predicted in GaAlAs. In the other semiconductors, incorporation may be expected depending on the partial pressures of the reactants and the substrate temperature. It is shown that incorporation from CO is unlikely.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.