Abstract
Temperature stability of voltage tunability and figure of merit (FOM) were investigated for the pulsed laser deposited Ba0.6Sr0.4TiO3 (BST0.6) thin films on platinum coated silicon [Pt(111)/TiOx/SiOx/Si(100)] substrates. The structural and micro-structural properties of these films were analyzed using x-ray diffraction (XRD) and atomic force microscopy (AFM), respectively. Metal-ferroelectric-metal (MFM) mono-dielectric layer stacks were fabricated using these films and their temperature and voltage dependent dielectric properties were quantified. The temperature dependence of dielectric properties were analysed using the modified Curie-Weiss law. The films showed a good dielectric tunability of about 40% at a bias field of 125 kV/cm. The determined figure of merits are found to be highly sensitive to the temperature changes. The observed ferroelectric-like behaviour in these films above the Curie point (Tc) has been attributed to the thermal expansion mismatch and the substrate induced misfit strain with the Pt/Si substrate.
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