Abstract
Thermally stimulated current (TSC) is a simple and effective test technique to study the thermal activated charge, electron trap and activation energy of dielectric and semiconducting materials. It is well known that the addition of glass frits can improve the degradation property of ZnO varistors. An activation energy of 0.45 eV has been found on the ZnO varistors with/without glass frits after the DC degradation by using TSC method. The tested quantity of thermal activated charges, QTSC, may represent the numbers of migrated zinc interstitials. ZnO visitors doped with glass frits have less QTSC. Experiment indicates that TSC test is a convenient method to evaluate the degradation behavior of ZnO varistors.
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