The Sustained Oscillation Modeling and Its Quantitative Suppression Methodology for GaN Devices

Abstract

Gallium nitride (GaN) devices are widely used due to their excellent performance when integrated into power electronics applications. However, owing to their low parasitic parameters and fast switching speed, they are more prone to instability than the silicon devices. The sustained oscillation discussed in this article is one of the instability problems, which may result in overshoot or even more serious device breakdown; thus, it is pretty necessary to suppress it effectively in practical applications. It is the first time to adopt an RC snubber to suppress the sustained oscillation in this article, which is very simple and cheap but effective. First, the sustained oscillation modeling based on a double pulse circuit is carried out. Then, the RC region is established quantitatively according to the root locus analysis results, which makes up for the defects of these qualitative methods before. Furthermore, it is first found that the sustained oscillation can be fully suppressed due to the existence of dipoles. Finally, the oscillation suppression effect within the RC region is compared with that outside the region by the simulation and experimental results, which are consistent with the theoretical analysis. Additionally, the possible negative influence of the added RC snubber is also discussed in this article, which shows that it has a little impact on the switching speed and energy loss, while the sustained oscillation is well suppressed.