Abstract
Thick polycrystalline Cd1−xZnxTe films with x ranged from 0.37 to 0.80 were obtained by the close spaced vacuum sublimation method. In order to investigate properties of the films structural, PIXE and Raman studies were carried out. Determination of chemical composition of the films by EDS, PIXE and XRD has shown good correlation of results. Raman spectroscopy reveals the relation between zinc concentration and vibrational properties of the films. Studies of the spatial distribution of the chemical elements on the film surface by micro-PIXE and micro-Raman spectroscopy have shown that films are uniform and free of secondary phases such as CdTe, ZnTe and Te inclusions.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
