Abstract
The surface morphology and microstructure of undoped and neodymium-doped silicate-phosphate films, as well as the strength characteristics (Young’s modulus and the hardness) of both the films and the SiO2-P2O5-Nd2O3/SLG and SiO2-P2O5/SLG composite structures, have been studied. A specific surface microstructure composed of the basic surface with imbedded round islands with a size of a few microns to a few tens of microns has been identified. The film’s microstructure has been shown to exhibit high stability over time after the long-term resting of these structures. It has been found that the films and the composite structures have fairly high strength properties.
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