Abstract
In this paper the surface binding energy model proposed by Reynolds for a binary alloy has been extended to a ternary system. From this model extension the steady state atomic surface fractions were calculated for a ternary surface alloy to be prepared by ion implanting a binary alloy of known composition. These predictions were compared with the results of the subsequent ion implantation experiments. The total implantation process was monitored by the observation of light emitted through de-excitation processes from sputtered neutral atoms. The experimental results reported are for nickel-chromium alloy implanted with 90 keV copper and tantalum and were analyzed using Rutherford backscattering, particle induced X-ray emission, and Auger surface analysis. From these results the partial sputtering yield for each component, net sputtering yield and surface atomic fractions were determined, and then compared with the predicted values. The different analytical techniques show consistent agreement within experimental error and there is reasonable agreement between the experimental results and the predicted values.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.