Abstract
The paper describes a method for determining the properties of thin films: elastic constants, viscosity and density. The method is based on the analysis of changing the characteristics of the acoustic resonator, on the surface of which the film under study is deposited, in comparison with a free resonator. Using the described method, the properties of two organic films based on the mycelium of basidiomycete Hericium erinaceus (Bull.) Persoon were determined.
Highlights
One of the possible applications of the acoustic piezoresonators is the determination of the mechanical characteristics of films
To determine the characteristics of the film under study, one can measure the electrical impedance of a free resonator without a film in a sufficiently wide frequency range
The previously developed method was used to determine the elastic constants, viscosity and density of the studied organic films based on the mycelium of Hericium erinaceus (Bull.) Persoon
Summary
One of the possible applications of the acoustic piezoresonators is the determination of the mechanical characteristics of films. The material constants of the resonator material can be determined using the equivalent Mason scheme [1, 2] or by solving the “inverse problem” [3] The latter method is called one of broadband acoustic spectroscopy. The possibility of using films from the mycelium of basidiomycetes to create chemical gas sensors was previously shown [2, 4] To simulate such devices, information is needed on the physical characteristics of such films. Information is needed on the physical characteristics of such films In this regard, the previously developed method was used to determine the elastic constants, viscosity and density of the studied organic films based on the mycelium of Hericium erinaceus (Bull.) Persoon
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