Abstract
A method for measuring adhesion between the glass shell and the metallic nucleus of an amorphous microwire was developed. It was revealed that the stress of separation of the glass shell from the metallic nucleus (pull-off stress) can vary from hundreds of MPa to units of GPa. It was found that the adhesion value between the glass shell and the metallic nucleus is 270 MPa. It was found that the annealing of microwires below crystallization temperature can lead to a more than 2-fold increase in the adhesion. The effect of adhesion on the stress state and coercivity of microwires under tension was analyzed.
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