Abstract
The trapped magnetic flux distribution was studied in thin flat superconducting samples of 1-2-3 compound having both a large demagnetization factor and a high edge barrier for vortex entry and exit. A three-dimensional analysis of neutron polarization was used to obtain the distribution patterns. It is shown that the nature of the critical state in polycrystalline wafers, unlike that in a ceramic wafer, is not described by the Bean model.
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