Year-end Sale % OFF 
Abstract
Transmission electron microscopy (TEM), electron energy-loss spectroscopy (EELS), and energy dispersive X-ray analysis (EDX) have been performed on thin zirconia films produced by means of self-assembled monolayer (SAM) mediated deposition from aqueous zirconium sulfate dispersion at 50 °C. As-grown films were found to be amorphous. Electron beam irradiation can induce crystallization of the as-grown amorphous zirconia films to tetragonal polycrystalline ZrO 2 films. EELS revealed changes in the oxygen K-edge peak caused by the beam-induced structural transition of the amorphous phase to tetragonal ZrO 2.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
