Abstract
The microstructure of the nickel silicide, Ni5Si2, which forms during solid-state reactions using self-supporting Ni-Si lateral-diffusion couples, has been studied using high-resolution electron microscopy (HREM) and selected-area electron diffraction. Two different structures for Ni5Si2 have been identified, one of which is consistent with the crystal structure which has been reported to have an actual composition of Ni31Si12. There is evidence for the existence of a third structure. Variations in the distribution of these structures and the presence of planar defects may account for the reported composition range of Ni5Si2 in the Ni-Si phase diagram. The observed HREM images are compared with computer simulated images.
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