Abstract

A systematic analysis of those liquid binary 2:1 systems (denoted MX 2 ), for which experimental partial structure factors are available from the isotopic substitution method in neutron diffraction, is made using the Bhatia-Thornton (BT) formalism.Particular attention is paid to the origin of the first sharp diffraction peak (FSDP ), which occurs in the measured diffraction patterns for some of the MX 2 systems, since it appears, from recent studies, that this feature is a signature of directional bonding. It is found that FSDPS can occur in all three BT partial structure factors S xB (k). A FSDP feature in the concentration-concentration partial structure factor S cc (k) is not, however, pronounced except in the case of MgCl 2 and the glass forming network melts ZnCl 2 and GeSe 2 . To the extent that these systems can be regarded as ionic melts a FSDP in S cc (k) implies a non-uniformity in the charge distribution on the scale of the intermediate-range order (IRO). The structure of molten GeSe 2 is compared with the structures of molten ZnCl 2 , glassy GeS 2 and glassy Si0 2 . Although the GeSe 2 and ZnCl 2 melts have different short-range order, there are similarities in the observed IRO which can be attributed to the arrangement of the electropositive species M. The essential features of the measured total structure factor for glassy GeS 2 can be reproduced by using the molten GeSe 2 S zB (k). This result lends support to the notion that the S zB (k) for liquid GeSe 2 (and ZnCl 2 ) are characteristic of both the liquid and glassy states of other network glass forming systems. The structures of molten GeSe 2 (or ZnCl 2 ) and glassy Si0 2 are, however, found to be different. The observed discrepancies are largest in the region of the FSDP which signifies pronounced differences in the nature of the IRO for these systems.

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