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Abstract
To investigate the structure of evaporated tapes used in magnetic recording, and particularly the possible presence of a surface oxide layer, several tape samples were fabricated by oxygen reaction oblique-incidence evaporation, varying the amount of reacting oxygen, and analyzed the sample structures by XPS, AES, and X-ray diffraction. It was found that the region near the surface is a mixed phase of metal atoms and oxides. These oxides changed from CoO to Co <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> O <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</inf> +CoO, and then to Co <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> O <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</inf> , as the amount of oxygen was increased. However, intermixing of CoO with metal atoms is thought to contribute to the film durability.
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