Abstract
Studies of the structure, dielectric and optical properties of thin films of a relaxor ferroelectric Ba0.5Sr0.5Nb2O6 grown on Pt(111)/Al2O3 (c-cut) substrate by high-frequency RF-sputtering in oxygen atmosphere, were performed. X-ray diffraction studies showed that Ba0.5Sr0.5Nb2O6 films are c-oriented. The unit cell parameters in the tetragonal approximation were c = 3.949(1) A and a = 12.38(1) A. It was established that the ferroelectric–paraelectric phase-transition temperature rises and optical anisotropy increases in the object in comparison with the bulk material. Reasons for the elucidated regularities are discussed.
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